BibSLEIGH — Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections

Adam Kristof
Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections
DATE, 1997.

EDTC 1997

@inproceedings{EDTC-1997-Kristof,
	author        = "Adam Kristof",
	booktitle     = "{Proceedings of the Second European Design and Test Conference}",
	doi           = "10.1109/EDTC.1997.582443",
	pages         = "630",
	publisher     = "{IEEE}",
	title         = "{Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections}",
	year          = 1997,
}

Adam KristofExtension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnectionsDATE, 1997.

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Adam Kristof
Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections
DATE, 1997.