Manoj Sachdev
Deep sub-micron IDDQ testing: issues and solutions
DATE, 1997.
@inproceedings{EDTC-1997-Sachdev, author = "Manoj Sachdev", booktitle = "{Proceedings of the Second European Design and Test Conference}", doi = "10.1109/EDTC.1997.582370", pages = "271--278", publisher = "{IEEE}", title = "{Deep sub-micron IDDQ testing: issues and solutions}", year = 1997, }