Manoj Sachdev
Deep sub-micron IDDQ testing: issues and solutions
DATE, 1997.
@inproceedings{EDTC-1997-Sachdev,
author = "Manoj Sachdev",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582370",
pages = "271--278",
publisher = "{IEEE}",
title = "{Deep sub-micron IDDQ testing: issues and solutions}",
year = 1997,
}











