Viera Stopjaková, Hans A. R. Manhaeve
CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits
DATE, 1997.
@inproceedings{EDTC-1997-StopjakovaM,
author = "Viera Stopjaková and Hans A. R. Manhaeve",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582369",
pages = "266--270",
publisher = "{IEEE}",
title = "{CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits}",
year = 1997,
}











