Travelled to:1 × France
1 × Germany
Collaborated with:H.A.R.Manhaeve M.Sidiropulos
Talks about:monitor (2) current (2) test (2) cmos (2) transient (1) conveyor (1) complex (1) circuit (1) voltag (1) iddq (1)
Person: Viera Stopjaková
DBLP: Stopjakov=aacute=:Viera
Contributed to:
19991997Wrote 2 papers:
- DATE-1999-StopjakovaMS #monitoring #testing
- On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC (VS, HARM, MS), pp. 538–542.
- EDTC-1997-StopjakovaM #monitoring #testing
- CCII+ current conveyor based BIC monitor for IDDQ testing of complex CMOS circuits (VS, HARM), pp. 266–270.