The Bayesian logistic regression in pattern recognition problems under concept drift
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Pavel A. Turkov, Olga Krasotkina, Vadim Mottl
The Bayesian logistic regression in pattern recognition problems under concept drift
ICPR, 2012.

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@inproceedings{ICPR-2012-TurkovKM,
	author        = "Pavel A. Turkov and Olga Krasotkina and Vadim Mottl",
	booktitle     = "{Proceedings of the 21st International Conference on Pattern Recognition}",
	isbn          = "978-1-4673-2216-4",
	pages         = "2976--2979",
	publisher     = "{IEEE Computer Society}",
	title         = "{The Bayesian logistic regression in pattern recognition problems under concept drift}",
	year          = 2012,
}

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