Puneet Gupta, David S. Doermann, Daniel DeMenthon
Beam Search for Feature Selection in Automatic SVM Defect Classification
ICPR, 2002.
@inproceedings{ICPR-v2-2002-GuptaDD,
author = "Puneet Gupta and David S. Doermann and Daniel DeMenthon",
booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 2}",
doi = "10.1109/ICPR.2002.1048275",
isbn = "0-7695-1695-5",
pages = "212--215",
publisher = "{IEEE Computer Society}",
title = "{Beam Search for Feature Selection in Automatic SVM Defect Classification}",
year = 2002,
}