BibSLEIGH — Puneet

Travelled to:

1 × Canada
1 × Germany
11 × USA
3 × France

Collaborated with:

A.B.Kahng D.Sylvester A.Nicolau S.Shah A.A.Kagalwalla R.S.Ghaida P.Sharma F.Heng N.Dutt N.D.Dutt Y.Kim J.Yang A.BanaiyanMofrad M.Gottscho Y.Badr A.Torres Y.Chen D.S.Doermann D.DeMenthon L.Lai V.Chandra R.C.Aitken L.A.D.Bathen T.Chan J.Sartori R.Kumar A.Kasibhatla S.Sarma N.Venkatasubramanian A.Nicolau L.Cheng C.J.Spanos K.Qian L.He L.Capodieci M.Shoushtari L.F.Wanner R.Balani S.Zahedi C.Apte M.B.Srivastava J.Henkel L.Bauer S.R.Nassif M.Shafique M.B.Tahoori N.Wehn

Talks about:

methodolog (4) awar (4) variabl (3) system (3) design (3) time (3) mask (3) cost (3) base (3) systemat (2)

Person: Puneet Gupta

DBLP: Gupta:Puneet

Contributed to:

2015

2014

2013

2012

2011

2010

2009

2008

2007

2006

2005

2004

2003

2002

Wrote 23 papers:

DAC-2015-BadrTG #hybrid #synthesis: Mask assignment and synthesis of DSA-MP hybrid lithography for sub-7nm contacts/vias (YB, AT, PG), p. 6.
DAC-2015-KagalwallaG #effectiveness #modelling #reduction: Effective model-based mask fracturing for mask cost reduction (AAK, PG), p. 6.
DATE-2015-SarmaDGVN #paradigm #self: Cyberphysical-system-on-chip (CPSoC): a self-aware MPSoC paradigm with cross-layer virtual sensing and actuation (SS, NDD, PG, NV, AN), pp. 625–628.
DAC-2014-DuttGNBGS #memory management #multi: Multi-Layer Memory Resiliency (ND, PG, AN, AB, MG, MS), p. 6.
DAC-2014-GottschoBDNG #capacity #energy #fault tolerance #scalability: Power / Capacity Scaling: Energy Savings With Simple Fault-Tolerant Caches (MG, AB, ND, AN, PG), p. 6.
DAC-2013-HenkelBDGNSTW #lessons learnt #reliability #roadmap: Reliable on-chip systems in the nano-era: lessons learnt and future trends (JH, LB, ND, PG, SRN, MS, MBT, NW), p. 10.
DATE-2013-GhaidaG #design #development #multi #process: Role of design in multiple patterning: technology development, design enablement and process control (RSG, PG), pp. 314–319.
DATE-2013-LaiCAG #monitoring #named #online: SlackProbe: a low overhead in situ on-line timing slack monitoring methodology (LL, VC, RCA, PG), pp. 282–287.
DATE-2012-BathenDNG #memory management #named #variability: VaMV: Variability-aware Memory Virtualization (LADB, NDD, AN, PG), pp. 284–287.
DATE-2011-ChanSGK #on the: On the efficacy of NBTI mitigation techniques (TBC, JS, PG, RK), pp. 932–937.
DATE-2011-WannerBZAGS #embedded #scheduling #variability: Variability-aware duty cycle scheduling in long running embedded sensing systems (LFW, RB, SZ, CA, PG, MBS), pp. 131–136.
DAC-2010-GuptaKKS #benchmark #heuristic #metric #named: Eyecharts: constructive benchmarking of gate sizing heuristics (PG, ABK, AK, PS), pp. 597–602.
DAC-2009-ChengGSQH #modelling #variability: Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability (LC, PG, CJS, KQ, LH), pp. 104–109.
DAC-2008-GuptaK #bound: Bounded-lifetime integrated circuits (PG, ABK), pp. 347–348.
DAC-2007-GuptaKKSS: Line-End Shortening is Not Always a Failure (PG, ABK, YK, SS, DS), pp. 270–271.
DAC-2006-ShahGK #library #optimisation #reduction #standard: Standard cell library optimization for leakage reduction (SS, PG, ABK), pp. 983–986.
DAC-2005-GuptaKKS #analysis: Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions (PG, ABK, YK, DS), pp. 365–368.
DAC-2004-CapodieciGKSY #design #towards: Toward a methodology for manufacturability-driven design rule exploration (LC, PG, ABK, DS, JY), pp. 311–316.
DAC-2004-GuptaH #towards: Toward a systematic-variation aware timing methodology (PG, FLH), pp. 321–326.
DAC-2004-GuptaKSS #effectiveness #runtime: Selective gate-length biasing for cost-effective runtime leakage control (PG, ABK, PS, DS), pp. 327–330.
DAC-2003-ChenGK #synthesis: Performance-impact limited area fill synthesis (YC, PG, ABK), pp. 22–27.
DAC-2003-GuptaKSY #off the shelf #tool support: A cost-driven lithographic correction methodology based on off-the-shelf sizing tools (PG, ABK, DS, JY), pp. 16–21.
ICPR-v2-2002-GuptaDD #automation #classification #fault #feature model: Beam Search for Feature Selection in Automatic SVM Defect Classification (PG, DSD, DD), pp. 212–215.