@inproceedings{ICSE-2012-DevosPDBMA,
	author        = "Nicolas Devos and Christophe Ponsard and Jean-Christophe Deprez and Renaud Bauvin and Benedicte Moriau and Guy Anckaerts",
	booktitle     = "{Proceedings of the 34th International Conference on Software Engineering}",
	doi           = "10.1109/ICSE.2012.6227107",
	editor        = "Martin Glinz and Gail C. Murphy and Mauro Pezzè",
	isbn          = "978-1-4673-1067-3",
	pages         = "1123--1132",
	publisher     = "{IEEE}",
	title         = "{Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain}",
	year          = 2012,
}