Travelled to:
1 × France
1 × USA
Collaborated with:
S.K.Gupta
Talks about:
test (3) generat (2) delay (2) satisfi (1) pattern (1) combin (1) circut (1) stuck (1) fault (1) path (1)
Person: Chih-Ang Chen
DBLP: Chen:Chih=Ang
Contributed to:
Wrote 2 papers:
- DAC-1996-ChenG #fault #generative #satisfiability
- A Satisfiability-Based Test Generator for Path Delay Faults in Combinational Circuts (CAC, SKG), pp. 209–214.
- EDAC-1994-ChenG #generative #testing
- BIST Test Pattern Generators for Stuck-Open and Delay Testing (CAC, SKG), pp. 289–296.