Travelled to:
2 × France
Collaborated with:
Y.Zorian H.Ihs W.Rahajandraibe D.Auvergne B.Cialdella B.Majoux V.Chowdhury
Talks about:
test (4) determinist (1) capacitor (1) synthesi (1) structur (1) determin (1) sequenc (1) pattern (1) paramet (1) generat (1)
Person: Christian Dufaza
DBLP: Dufaza:Christian
Contributed to:
Wrote 3 papers:
- DATE-2002-RahajandraibeDACMC #parametricity
- Test Structure for IC(VBE) Parameter Determination of Low Voltage Applications (WR, CD, DA, BC, BM, VC), pp. 316–321.
- EDTC-1997-DufazaZ #generative #on the #pseudo #sequence #testing
- On the generation of pseudo-deterministic two-patterns test sequence with LFSRs (CD, YZ), pp. 69–76.
- EDTC-1997-IhsD #synthesis
- Test synthesis for DC test of switched-capacitors circuits (HI, CD), p. 616.