Travelled to:1 × France
Collaborated with:M.Saliva F.Cacho V.Huard X.Federspiel A.Benhassain A.Bravaix L.Anghel
Talks about:reliabl (1) monitor (1) circuit (1) deplet (1) fulli (1) digit (1) situ (1) soi (1)
Person: D. Angot
DBLP: Angot:D=
Contributed to:
2015Wrote 1 papers:
- DATE-2015-SalivaCHFABBA #monitoring #reliability
- Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI (MS, FC, VH, XF, DA, AB, AB, LA), pp. 441–446.