Travelled to:
1 × France
Collaborated with:
M.Saliva F.Cacho V.Huard X.Federspiel D.Angot A.Benhassain A.Bravaix
Talks about:
reliabl (1) monitor (1) circuit (1) deplet (1) fulli (1) digit (1) situ (1) soi (1)
Person: L. Anghel
DBLP: Anghel:L=
Contributed to:
Wrote 1 papers:
- DATE-2015-SalivaCHFABBA #monitoring #reliability
- Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI (MS, FC, VH, XF, DA, AB, AB, LA), pp. 441–446.