4 papers:
DATE-2015-SalivaCHFABBA #monitoring #reliability- Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI (MS, FC, VH, XF, DA, AB, AB, LA), pp. 441–446.
- DATE-2013-BeigneVGTBTBMBMFNAPGCRCEW #design
- Ultra-wide voltage range designs in fully-depleted silicon-on-insulator FETs (EB, AV, BG, OT, TB, YT, SB, GM, OB, YM, PF, JPN, FA, BPP, AG, SC, PR, JLC, SE, RW), pp. 613–618.
LICS-2003-GradelK #fixpoint- Will Deflation Lead to Depletion? On Non-Monotone Fixed Point Inductions (EG, SK), p. 158–?.
DAC-2000-ShepardK #analysis- Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology (KLS, DJK), pp. 239–242.
