Travelled to:
1 × China
1 × Romania
1 × United Kingdom
2 × Germany
2 × India
3 × USA
Collaborated with:
M.Gopinathan A.De P.Bouyer R.Komondoor P.Madhusudan R.Nasre A.Roychoudhury F.Chevalier N.Chopra R.Pai I.Bhattacharya S.Kale H.S.Gupta G.M.Rama S.Ramesh P.Sampath A.Petit P. Ezudheen D.Neider Pranav Garg 0001
Talks about:
control (3) analysi (3) system (3) time (3) conflict (2) toler (2) model (2) match (2) exist (2) java (2)
Person: Deepak D'Souza
DBLP: D'Souza:Deepak
Facilitated 1 volumes:
Contributed to:
Wrote 12 papers:
- WCRE-2013-KomondoorBDK #domain model #modelling #using
- Using relationships for matching textual domain models with existing code (RK, IB, DD, SK), pp. 371–380.
- ECOOP-2012-DeD #analysis #java #pointer #scalability
- Scalable Flow-Sensitive Pointer Analysis for Java with Strong Updates (AD, DD), pp. 665–687.
- ESOP-2011-DeDN #analysis #data flow #source code
- Dataflow Analysis for Datarace-Free Programs (AD, DD, RN), pp. 196–215.
- ICSM-2010-GuptaDKR #case study #implementation
- A case study in matching service descriptions to implementations in an existing system (HSG, DD, RK, GMR), pp. 1–10.
- CASE-2009-DSouzaGRS #realtime
- Supervisory control for real-time systems based on conflict-tolerant controllers (DD, MG, SR, PS), pp. 555–560.
- CAV-2008-DSouzaG
- Conflict-Tolerant Features (DD, MG), pp. 227–239.
- PASTE-2008-DeRD #java #memory management #validation
- Java memory model aware software validation (AD, AR, DD), pp. 8–14.
- SEFM-2006-DSouzaG #graph
- Computing Complete Test Graphs for Hierarchical Systems (DD, MG), pp. 70–79.
- FoSSaCS-2005-BouyerCD #automaton #fault #using
- Fault Diagnosis Using Timed Automata (PB, FC, DD), pp. 219–233.
- CAV-2003-BouyerDMP
- Timed Control with Partial Observability (PB, DD, PM, AP), pp. 180–192.
- ESOP-2019-ChopraPD #kernel #static analysis
- Data Races and Static Analysis for Interrupt-Driven Kernels (NC, RP, DD), pp. 697–723.
- OOPSLA-2018-EzudheenND0M #contract #invariant #learning
- Horn-ICE learning for synthesizing invariants and contracts (PE, DN, DD, PG0, PM), p. 25.