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Travelled to:
1 × USA
Collaborated with:
F.R.Ashley H.J.Savard
Talks about:
circuit (1) system (1) measur (1) integr (1) micro (1) autom (1) mask (1)

Person: E. B. Murphy

DBLP DBLP: Murphy:E=_B=

Contributed to:

DAC 19701970

Wrote 1 papers:

DAC-1970-AshleyMS #automation #metric
An automated micro measurement system for integrated circuit masks (FRA, EBM, HJS), pp. 17–27.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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