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Travelled to:
1 × USA
Collaborated with:
F.R.Ashley E.B.Murphy
Talks about:
circuit (1) system (1) measur (1) integr (1) micro (1) autom (1) mask (1)

Person: H. J. Savard

DBLP DBLP: Savard:H=_J=

Contributed to:

DAC 19701970

Wrote 1 papers:

DAC-1970-AshleyMS #automation #metric
An automated micro measurement system for integrated circuit masks (FRA, EBM, HJS), pp. 17–27.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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