Travelled to:
1 × USA
Collaborated with:
E.B.Murphy H.J.Savard
Talks about:
circuit (1) system (1) measur (1) integr (1) micro (1) autom (1) mask (1)
Person: F. R. Ashley
DBLP: Ashley:F=_R=
Contributed to:
Wrote 1 papers:
- DAC-1970-AshleyMS #automation #metric
- An automated micro measurement system for integrated circuit masks (FRA, EBM, HJS), pp. 17–27.