Travelled to:1 × USA
Collaborated with:T.Whitney
Talks about:design (2) check (2) layout (1) integr (1) verif (1) immun (1) rule (1) look (1) new (1)
Person: Edward J. McGrath
DBLP: McGrath:Edward_J=
Contributed to:
1980Wrote 1 papers:
- DAC-1980-McGrathW #design #layout #verification
- Design integrity and immunity checking: A new look at layout verification and design rule checking (EJM, TW), pp. 263–268.