Travelled to:1 × France
1 × Germany
1 × USA
Collaborated with:Y.Cai K.Mai O.Mutlu Y.Luo
Talks about:character (3) memori (3) flash (3) nand (3) mlc (3) analysi (2) threshold (1) distribut (1) recoveri (1) pattern (1)
Person: Erich F. Haratsch
DBLP: Haratsch:Erich_F=
Contributed to:
2015
20132012Wrote 3 papers:
- HPCA-2015-CaiLHMM #memory management #optimisation
- Data retention in MLC NAND flash memory: Characterization, optimization, and recovery (YC, YL, EFH, KM, OM), pp. 551–563.
- DATE-2013-CaiHMM #analysis #memory management #modelling
- Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling (YC, EFH, OM, KM), pp. 1285–1290.
- DATE-2012-CaiHMM #analysis #fault #memory management #metric
- Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis (YC, EFH, OM, KM), pp. 521–526.