Travelled to:1 × France
2 × Germany
2 × USA
Collaborated with:M.Bhargava Y.Cai E.F.Haratsch O.Mutlu S.Nalam B.H.Calhoun Y.Luo
Talks about:character (3) memori (3) flash (3) nand (3) mlc (3) analysi (2) design (2) optim (2) cryptograph (1) threshold (1)
Person: Ken Mai
DBLP: Mai:Ken
Contributed to:
2015
201420132012
2010Wrote 5 papers:
- HPCA-2015-CaiLHMM #memory management #optimisation
- Data retention in MLC NAND flash memory: Characterization, optimization, and recovery (YC, YL, EFH, KM, OM), pp. 551–563.
- DATE-2014-BhargavaM #encryption #generative #performance #reliability
- An efficient reliable PUF-based cryptographic key generator in 65nm CMOS (MB, KM), pp. 1–6.
- DATE-2013-CaiHMM #analysis #memory management #modelling
- Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling (YC, EFH, OM, KM), pp. 1285–1290.
- DATE-2012-CaiHMM #analysis #fault #memory management #metric
- Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis (YC, EFH, OM, KM), pp. 521–526.
- DAC-2010-NalamBMC #design #optimisation #prototype
- Virtual prototyper (ViPro): an early design space exploration and optimization tool for SRAM designers (SN, MB, KM, BHC), pp. 138–143.