Travelled to:
1 × USA
Collaborated with:
X.Liang Q.Xu K.Chakrabarty N.Jing L.Jiang
Talks about:
metal (1) cnfet (1) test (1) sram (1) jump (1) cnts (1) base (1)
Person: Feng Xie
DBLP: Xie:Feng
Contributed to:
Wrote 1 papers:
- DAC-2015-XieLXCJJ
- Jump test for metallic CNTs in CNFET-based SRAM (FX, XL, QX, KC, NJ, LJ), p. 6.