Travelled to:1 × France
Collaborated with:T.N.Kumar F.Lombardi
Talks about:memristor (1) monitor (1) detect (1) fault (1) oper (1) base (1) lut (1)
Person: Haider A. F. Almurib
DBLP: Almurib:Haider_A=_F=
Contributed to:
2015Wrote 1 papers:
- DATE-2015-KumarAL #detection #fault #monitoring
- Operational fault detection and monitoring of a memristor-based LUT (TNK, HAFA, FL), pp. 429–434.