Travelled to:1 × France
Collaborated with:H.A.F.Almurib F.Lombardi
Talks about:memristor (1) monitor (1) detect (1) fault (1) oper (1) base (1) lut (1)
Person: T. Nandha Kumar
DBLP: Kumar:T=_Nandha
Contributed to:
2015Wrote 1 papers:
- DATE-2015-KumarAL #detection #fault #monitoring
- Operational fault detection and monitoring of a memristor-based LUT (TNK, HAFA, FL), pp. 429–434.