Travelled to:
1 × USA
Collaborated with:
A.Tsukizoe J.Sakemi T.Kozawa
Talks about:
pattern (1) checker (1) vlsi (1) mask (1) mach (1) high (1) data (1) hit (1)
Person: Hiroshi Fukuda
DBLP: Fukuda:Hiroshi
Contributed to:
Wrote 1 papers:
- DAC-1983-TsukizoeSKF
- MACH : a high-hitting pattern checker for VLSI mask data (AT, JS, TK, HF), pp. 726–731.