Travelled to:
1 × USA
Collaborated with:
T.Huang C.Kung K.Cheng
Talks about:
electron (1) reliabl (1) flexibl (1) analysi (1) integr (1) driver (1) studi (1) scan (1) case (1) tft (1)
Person: Huai-Yuan Tseng
DBLP: Tseng:Huai=Yuan
Contributed to:
Wrote 1 papers:
- DAC-2007-HuangTKC #analysis #case study #flexibility #reliability
- Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver (TCH, HYT, CPK, KTC), pp. 966–969.