Travelled to:
1 × USA
Collaborated with:
∅
Talks about:
predict (1) circuit (1) detect (1) design (1) combin (1) fault (1) tool (1) new (1)
Person: John L. Fike
DBLP: Fike:John_L=
Contributed to:
Wrote 1 papers:
- DAC-1975-Fike #design #detection #fault #predict #question
- Predicting fault detectability in combinational circuits — a new design tool? (JLF), pp. 290–295.