Travelled to:
1 × USA
Collaborated with:
∅
Talks about:
opportun (1) challeng (1) beyond (1) scale (1) cmos (1)
Person: Kelin J. Kuhn
DBLP: Kuhn:Kelin_J=
Contributed to:
Wrote 1 papers:
- DAC-2009-Kuhn #challenge #scalability
- CMOS scaling beyond 32nm: challenges and opportunities (KJK), pp. 310–313.