Travelled to:
1 × France
Collaborated with:
A.DeOrio Q.Li V.Bertacco
Talks about:
diagnosi (1) silicon (1) anomali (1) machin (1) detect (1) learn (1) post (1) base (1) bug (1)
Person: Matthew Burgess
DBLP: Burgess:Matthew
Contributed to:
Wrote 1 papers:
- DATE-2013-DeOrioLBB #debugging #detection #machine learning
- Machine learning-based anomaly detection for post-silicon bug diagnosis (AD, QL, MB, VB), pp. 491–496.