Travelled to:1 × France
1 × Germany
Collaborated with:C.Wegener
Talks about:model (2) base (2) incorpor (1) identif (1) coverag (1) convert (1) signal (1) linear (1) calibr (1) fault (1)
Person: Michael Peter Kennedy
DBLP: Kennedy:Michael_Peter
Contributed to:
20032000Wrote 2 papers:
- DATE-2003-WegenerK #fault #identification #linear #modelling
- Linear Model-Based Error Identification and Calibration for Data Converters (CW, MPK), pp. 10630–10635.
- DATE-2000-WegenerK #modelling #testing
- Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs (CW, MPK), p. 765.