Travelled to:
1 × Canada
1 × Switzerland
1 × USA
Collaborated with:
T.Klinger B.K.Ray R.Delmonico T.T.Nguyen T.N.Nguyen E.Duesterwald P.L.Li M.Shaw J.D.Herbsleb
Talks about:
softwar (2) project (2) defect (2) expertis (1) product (1) develop (1) analysi (1) system (1) deploy (1) assess (1)
Person: Peter Santhanam
DBLP: Santhanam:Peter
Contributed to:
Wrote 3 papers:
- ICSE-2012-NguyenNDKS #analysis #developer #fault
- Inferring developer expertise through defect analysis (TTN, TNN, ED, TK, PS), pp. 1297–1300.
- FSE-2004-LiSHRS #empirical #evaluation #fault #modelling
- Empirical evaluation of defect projection models for widely-deployed production software systems (PLL, MS, JDH, BKR, PS), pp. 263–272.
- SEKE-2004-RayKDS #assessment #automation #risk management
- Automated Risk Assessment for Managing Software Projects (BKR, TK, RD, PS), pp. 372–377.