Inferring developer expertise through defect analysis
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Tung Thanh Nguyen, Tien N. Nguyen, Evelyn Duesterwald, Tim Klinger, Peter Santhanam
Inferring developer expertise through defect analysis
ICSE, 2012.

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@inproceedings{ICSE-2012-NguyenNDKS,
	author        = "Tung Thanh Nguyen and Tien N. Nguyen and Evelyn Duesterwald and Tim Klinger and Peter Santhanam",
	booktitle     = "{Proceedings of the 34th International Conference on Software Engineering}",
	doi           = "10.1109/ICSE.2012.6227095",
	editor        = "Martin Glinz and Gail C. Murphy and Mauro Pezzè",
	isbn          = "978-1-4673-1067-3",
	pages         = "1297--1300",
	publisher     = "{IEEE}",
	title         = "{Inferring developer expertise through defect analysis}",
	year          = 2012,
}

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