Tung Thanh Nguyen, Tien N. Nguyen, Evelyn Duesterwald, Tim Klinger, Peter Santhanam
Inferring developer expertise through defect analysis
ICSE, 2012.
@inproceedings{ICSE-2012-NguyenNDKS,
author = "Tung Thanh Nguyen and Tien N. Nguyen and Evelyn Duesterwald and Tim Klinger and Peter Santhanam",
booktitle = "{Proceedings of the 34th International Conference on Software Engineering}",
doi = "10.1109/ICSE.2012.6227095",
editor = "Martin Glinz and Gail C. Murphy and Mauro Pezzè",
isbn = "978-1-4673-1067-3",
pages = "1297--1300",
publisher = "{IEEE}",
title = "{Inferring developer expertise through defect analysis}",
year = 2012,
}
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