Travelled to:
1 × Canada
1 × Norway
1 × Switzerland
Collaborated with:
P.Santhanam B.K.Ray R.Delmonico T.T.Nguyen T.N.Nguyen E.Duesterwald M.Kaplan A.M.Paradkar A.Sinha C.Williams C.Yilmaz
Talks about:
minimalist (1) expertis (1) approach (1) softwar (1) project (1) generat (1) develop (1) conform (1) analysi (1) defect (1)
Person: Tim Klinger
DBLP: Klinger:Tim
Contributed to:
Wrote 3 papers:
- ICSE-2012-NguyenNDKS #analysis #developer #fault
- Inferring developer expertise through defect analysis (TTN, TNN, ED, TK, PS), pp. 1297–1300.
- ICST-2008-KaplanKPSWY #approach #consistency #generative #less is more #modelling #testing #uml
- Less is More: A Minimalistic Approach to UML Model-Based Conformance Test Generation (MK, TK, AMP, AS, CW, CY), pp. 82–91.
- SEKE-2004-RayKDS #assessment #automation #risk management
- Automated Risk Assessment for Managing Software Projects (BKR, TK, RD, PS), pp. 372–377.