Travelled to:1 × USA
Collaborated with:H.Wang T.M.Khoshgoftaar A.Napolitano
Talks about:techniqu (2) softwar (2) select (2) metric (2) studi (2) statist (1) predict (1) featur (1) defect (1) order (1)
Person: Randall Wald
DBLP: Wald:Randall
Contributed to:
20132012Wrote 2 papers:
- SEKE-2013-WangKWN #case study #feature model #first-order #metric #statistics
- A Study on First Order Statistics-Based Feature Selection Techniques on Software Metric Data (HW, TMK, RW, AN), pp. 467–472.
- SEKE-2012-WangKWN #empirical #fault #metric #predict
- An Empirical Study of Software Metric Selection Techniques for Defect Prediction (HW, TMK, RW, AN), pp. 94–99.