Travelled to:1 × USA
2 × Canada
Collaborated with:J.R.Horgan W.E.Wong A.P.Mathur H.Agrawal E.W.Krauser
Talks about:effect (2) test (2) increment (1) regress (1) languag (1) coverag (1) detect (1) minim (1) fault (1) flow (1)
Person: Saul London
DBLP: London:Saul
Contributed to:
1995
1993
1991Wrote 3 papers:
- ICSE-1995-WongHLM #detection #effectiveness #fault #testing
- Effect of Test Set Minimization on Fault Detection Effectiveness (WEW, JRH, SL, APM), pp. 41–50.
- CSM-1993-AgrawalHKL #incremental #testing
- Incremental Regression Testing (HA, JRH, EWK, SL), pp. 348–357.
- TAV-1991-HorgnaL #c #data flow
- Data Flow Coverage and the C Language (JRH, SL), pp. 87–97.