Travelled to:
1 × USA
Collaborated with:
A.Yamada N.Wakatsuki S.Funatsu
Talks about:
system (2) generat (1) automat (1) locat (1) level (1) fault (1) digit (1) test (1) larg (1)
Person: T. Fukui
DBLP: Fukui:T=
Contributed to:
Wrote 1 papers:
- DAC-1978-YamadaWFF #automation #fault #generative #scalability #testing
- Automatic System Level Test Generation and Fault Location for Large Digital Systems (AY, NW, TF, SF), pp. 347–352.