Travelled to:2 × USA
Collaborated with:R.Rajsuman A.P.Jayasumana H.Joh
Talks about:fault (2) discoveri (1) accuraci (1) process (1) pattern (1) complex (1) vulner (1) variat (1) switch (1) season (1)
Person: Yashwant K. Malaiya
DBLP: Malaiya:Yashwant_K=
Contributed to:
2009
19891987Wrote 3 papers:
- ICST-2009-JohM #process
- Seasonal Variation in the Vulnerability Discovery Process (HJ, YKM), pp. 191–200.
- DAC-1989-RajsumanJM #detection #fault #using
- CMOS Stuck-open Fault Detection Using Single Test Patterns (RR, APJ, YKM), pp. 714–717.
- DAC-1987-RajsumanMJ #fault #modelling #on the
- On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates (RR, YKM, APJ), pp. 244–250.