Travelled to:1 × USA
Collaborated with:R.Rajsuman Y.K.Malaiya
Talks about:fault (2) accuraci (1) pattern (1) complex (1) switch (1) detect (1) stuck (1) singl (1) model (1) level (1)
Person: Anura P. Jayasumana
DBLP: Jayasumana:Anura_P=
Contributed to:
19891987Wrote 2 papers:
- DAC-1989-RajsumanJM #detection #fault #using
- CMOS Stuck-open Fault Detection Using Single Test Patterns (RR, APJ, YKM), pp. 714–717.
- DAC-1987-RajsumanMJ #fault #modelling #on the
- On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates (RR, YKM, APJ), pp. 244–250.