Travelled to:
1 × France
2 × USA
Collaborated with:
C.J.Liu W.Wu G.Lu W.Wu W.Xu R.Krishnan L.He C.Kuo I.Tsai L.Chan
Talks about:
circuit (4) analog (2) dimension (1) techniqu (1) behavior (1) approach (1) statist (1) process (1) flexibl (1) coverag (1)
Person: Yen-Lung Chen
DBLP: Chen:Yen=Lung
Contributed to:
Wrote 3 papers:
- DAC-2014-WuXKCH #named #simulation #statistics #towards
- REscope: High-dimensional Statistical Circuit Simulation towards Full Failure Region Coverage (WW, WX, RK, YLC, LH), p. 6.
- DATE-2013-ChenWLL #automation #flexibility #process
- Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects (YLC, WRW, GRL, CNJL), pp. 1458–1461.
- DAC-2010-KuoCTCL #approach #behaviour
- Behavior-level yield enhancement approach for large-scaled analog circuits (CCK, YLC, ICT, LYC, CNJL), pp. 903–908.