Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits
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Hyung Ki Lee, Dong Sam Ha, K. Kim
Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits
DAC, 1989.

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@inproceedings{DAC-1989-LeeHK,
	author        = "Hyung Ki Lee and Dong Sam Ha and K. Kim",
	booktitle     = "{Proceedings of the 26th Design Automation Conference}",
	doi           = "10.1145/74382.74440",
	pages         = "345--350",
	publisher     = "{ACM Press}",
	title         = "{Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits}",
	year          = 1989,
}

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