Travelled to:3 × USA
Collaborated with:D.S.Ha K.Kim
Talks about:circuit (3) stuck (3) fault (3) test (3) generat (2) effici (2) combin (2) open (2) cmos (2) synchron (1)
Person: Hyung Ki Lee
DBLP: Lee:Hyung_Ki
Contributed to:
199219901989Wrote 3 papers:
- DAC-1992-LeeH #fault #named #parallel #performance
- HOPE: An Efficient Parallel Fault Simulator for Synchronous Sequential Circuits (HKL, DSH), pp. 336–340.
- DAC-1990-LeeH #automation #fault #generative #named #performance
- SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits (HKL, DSH), pp. 660–666.
- DAC-1989-LeeHK #fault #generative #testing #using
- Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits (HKL, DSH, KK), pp. 345–350.