Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
DAC, 1992.
@inproceedings{DAC-1992-LeeNB,
acmid = "113938.113931",
author = "Kuen-Jong Lee and Charles Njinda and Melvin A. Breuer",
booktitle = "{Proceedings of the 29th Design Automation Conference}",
isbn = "0-8186-2822-7",
pages = "26--29",
publisher = "{IEEE Computer Society Press}",
title = "{SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits}",
year = 1992,
}