Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy
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Rolf Krieger, Bernd Becker, Martin Keim
Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy
DAC, 1995.

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@inproceedings{DAC-1995-KriegerBK,
	author        = "Rolf Krieger and Bernd Becker and Martin Keim",
	booktitle     = "{Proceedings of the 32nd Design Automation Conference}",
	doi           = "10.1145/217474.217552",
	isbn          = "0-89791-725-1",
	pages         = "339--344",
	publisher     = "{ACM Press}",
	title         = "{Symbolic Fault Simulation for Sequential Circuits and the Multiple Observation Time Test Strategy}",
	year          = 1995,
}

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