@inproceedings{DAC-2014-ChenWLWSC,
	author        = "Yu-Guang Chen and Tao Wang and Kuan-Yu Lai and Wan-Yu Wen and Yiyu Shi and Shih-Chieh Chang",
	booktitle     = "{Proceedings of the 51st Annual Design Automation Conference}",
	doi           = "10.1145/2593069.2593115",
	isbn          = "978-1-4503-2730-5",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs}",
	year          = 2014,
}