Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
DATE, 1998.
@inproceedings{DATE-1998-RudnickVECPR,
author = "Elizabeth M. Rudnick and Roberto Vietti and Akilah Ellis and Fulvio Corno and Paolo Prinetto and Matteo Sonza Reorda",
booktitle = "{Proceedings of the Third Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1998.655915",
pages = "570--576",
publisher = "{IEEE Computer Society}",
title = "{Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques}",
year = 1998,
}