Luong Dinh Hung, Hidetsugu Irie, Masahiro Goshima, Shuichi Sakai
Utilization of SECDED for soft error and variation-induced defect tolerance in caches
DATE, 2007.
@inproceedings{DATE-2007-HungIGS,
author = "Luong Dinh Hung and Hidetsugu Irie and Masahiro Goshima and Shuichi Sakai",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266612",
isbn = "978-3-9810801-2-4",
pages = "1134--1139",
publisher = "{ACM}",
title = "{Utilization of SECDED for soft error and variation-induced defect tolerance in caches}",
year = 2007,
}