Travelled to:1 × France
Collaborated with:H.Irie M.Goshima S.Sakai
Talks about:variat (1) defect (1) toler (1) induc (1) error (1) util (1) soft (1) secd (1) cach (1)
Person: Luong Dinh Hung
DBLP: Hung:Luong_Dinh
Contributed to:
2007Wrote 1 papers:
- DATE-2007-HungIGS #fault
- Utilization of SECDED for soft error and variation-induced defect tolerance in caches (LDH, HI, MG, SS), pp. 1134–1139.