Xiao Liu, Yubin Zhang, Feng Yuan, Qiang Xu
Layout-aware pseudo-functional testing for critical paths considering power supply noise effects
DATE, 2010.
@inproceedings{DATE-2010-LiuZYX,
author = "Xiao Liu and Yubin Zhang and Feng Yuan and Qiang Xu",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "1432--1437",
publisher = "{IEEE}",
title = "{Layout-aware pseudo-functional testing for critical paths considering power supply noise effects}",
year = 2010,
}