Travelled to:1 × Germany
1 × USA
Collaborated with:Q.Xu K.Chakrabarty X.Liu F.Yuan
Talks about:test (2) interconnect (1) architectur (1) function (1) suppli (1) signal (1) pseudo (1) layout (1) integr (1) extern (1)
Person: Yubin Zhang
DBLP: Zhang:Yubin
Contributed to:
2010
2007Wrote 2 papers:
- DATE-2010-LiuZYX #power management #pseudo #testing
- Layout-aware pseudo-functional testing for critical paths considering power supply noise effects (XL, YZ, FY, QX), pp. 1432–1437.
- DAC-2007-XuZC #architecture #fault #optimisation
- SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects (QX, YZ, KC), pp. 676–681.