Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation
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Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation
DATE, 2011.

DATE 2011
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@inproceedings{DATE-2011-GielenMW,
	author        = "Georges G. E. Gielen and Elie Maricau and Peter H. N. De Wit",
	booktitle     = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-61284-208-0",
	pages         = "1474--1479",
	publisher     = "{IEEE}",
	title         = "{Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation}",
	year          = 2011,
}

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