Test generation for clock-domain crossing faults in integrated circuits
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Naghmeh Karimi, Krishnendu Chakrabarty, Pallav Gupta, Srinivas Patil
Test generation for clock-domain crossing faults in integrated circuits
DATE, 2012.

DATE 2012
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@inproceedings{DATE-2012-KarimiCGP,
	acmid         = "2492811",
	author        = "Naghmeh Karimi and Krishnendu Chakrabarty and Pallav Gupta and Srinivas Patil",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "406--411",
	publisher     = "{IEEE}",
	title         = "{Test generation for clock-domain crossing faults in integrated circuits}",
	year          = 2012,
}

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